High and low temperature impact test box structure features
High-Low-Temperature Impact Chamber Features High-Low-Temperature Impact Test Chambers We also call temperature impact test chambers, cold and heat shock test chambers, and the equipment can withstand repeated and rapid temperature changes in the tested components and instruments. It is mainly used to test instruments. The adaptability of the instrument, machinery, electrician, electronic products, and parts and components, etc. under cold-resistant, rapid temperature changes or gradual changes in order to analyze and evaluate the performance and behavior of the test article under the proposed environmental conditions. The high and low temperature impact test chambers detect changes in the electrical properties and mechanical durability of the sample through alternating changes of high and low temperatures to screen out structural defects such as poor package sealing, bad lead welding, and plastic cracks. The following is a brief explanation of the working principle of the high-low temperature impact test box by Wuhan Shangchen Test Equipment Co., Ltd.
High-low temperature impact test box working principle: The test box passes the unit's heating system and cooling system, respectively, to produce a high temperature environment (70 °C ~ 125 °C) and a low temperature environment (-25 °C ~ -70 °C), according to the temperature impact test In related requirements, the component to be measured is placed in a loading basket of a designated greenhouse, and when the two greenhouses reach a preset temperature and are stable, the loading basket is driven by the transmission mechanism to move the tested component in the basket between the high and low greenhouses. During the moving process, the high and low greenhouses communicate with each other, and the tested components also enter the other greenhouse from a high or low temperature state. Therefore, a large number of cooling and heating loads will be brought in. The unit will quickly return to the greenhouse temperature through the cooling system or heating system. When the greenhouse temperature of the device under test stays stable for a long time, the carrier mechanism is reversed by the transmission mechanism to bring the device under test back to the original greenhouse, and the temperature must be quickly restored to the preset temperature. When the temperature is stable for a long time, Repeat the above operation to complete multiple temperature cycle impact tests.
High-low temperature impact test box schematic 
The structure of the high-low temperature impact test box is divided into four parts: the refrigeration system, the heating system, the transmission system and the electrical control system. The box of the high-low temperature impact test chamber produced by Wuhan Shangchen Test Equipment Co., Ltd. adopts a two-box longitudinal arrangement. The overall structure is simple, reducing the possibility of failure of the carrier basket when moving between two greenhouses. The transmission system adopts a pneumatic transmission device and facilitates the adjustment of the moving speed of the carrier basket and the components, and can quickly achieve the temperature impact of the measured components between the high and low greenhouses.
The working principle and structure of the high-low temperature impact test box in this period is introduced here. In the next stage of technical dynamics, we will introduce the high-low-temperature impact test box natural cascade refrigeration system, and conduct in-depth analysis of the design of the refrigeration system, interested customers. Can pay attention to our dynamics.
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